http://ieeexplore.ieee.org/

E-revues, e-standards et E-conférences

IEEE (Institute of Electrical and Electronics Engineers)

Texte intégral des revues IEEE, IEE et actes de congrès publiés depuis 1988 ainsi que des standards IEEE à jour. IEL (IEEE/IET ELECTRONIC LIBRARY) fournit l'accès aux publications de l'IEEE (Institut of Electrical and Electronics Engineering, US) et de l'IET (Institution of Engineering and Technology, GB) sur la plateforme IEEE Xplore.

• Standards : ceux applicables
• Autres sources : IEEE journals, transactions, letters, and magazines are available in IEEE Xplore from 1988 with select content back to 1913. IEEE conference proceedings are available in IEEE Xplore from 1988 with select content back to 1953.

he IEEE publishes more than 800 leading-edge conference proceedings in electrical engineering, computer science and related fields each year. Conference proceedings appear in IEEE Xplore approximately 30-60 days following receipt of the content by IEEE. Topics include Aerospace, Bio engineering ,Comm. Networking ,Components circuits and devices ,Computing Processing ,Eng. materials dielectric plasma,Eng. Profession,Fields, Waves & electromagnetics,General Topics for eng.(maths, Science & engineering ,Geosciences ,Nuclear Engineering ,Photonics and Electro Optics ,Power Energy and industry applications ,Robotics & control systems ,Signal Processing & analysis ,Transportation Please note that conference proceedings often arrive at the IEEE several weeks after the conference date.

Hebdomadaire

Après la création d'un compte personnel il estpossible d'enregister des alertes sur les sommaires de journaaux et de magazines. En savoir plus....

• To create an IEEE account
• User guide

Depuis le domaine informatique ENAC, via EZproxy à l'extérieur du domaine. 10 accès simultanés et une limite de 40 000 PDFs à télécharger annuellement

• IEL - User guides

IEEE allows authors to post a copy of the final peer-reviewed PDF on personal and institutional Web sites, a RoMEO green publisher.

En cas de problème, merci de contacter la bibliotheque@enac.fr, voir aussi : https://supportcenter.ieee.org/

Tag : SI